Hot-carrier degradation in ultra-thin fully-depleted accumulation-mode SIMOX n-MOSFET's

✍ Scribed by O. Faynot; S. Cristoloveanu; A.-J. Auberton-Hervé; G. Reimbold

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 322 KB
• Volume: 22
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(93)90199-f