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Hot carrier-induced degradation mechanisms in short-channel SIMOX p-MOSFET's

✍ Scribed by T. Ouisse; A.J. Auberton-Hervé; B. Giffard; G. Reimbold

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Mechanisms of hot-carrier induced degrad

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Hot-carrier degradation in ultra-thin fu

✍ O. Faynot; S. Cristoloveanu; A.-J. Auberton-Hervé; G. Reimbold 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 322 KB

Investigation of hot-carrier induced deg

✍ N. Revil; J.P. Miéville; S. Cristoloveanu; M. Dutoit; P. Mortini 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 295 KB

Low frequency noise in short-channel MOS

✍ Jen-Tai Hsu; Xiaoyu Li; C.R. Viswanathan 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 308 KB

A simple, analytical model for hot-carri

✍ T. Giebel; K. Goser 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 427 KB

Comparison of gate-edge effects on the h

✍ Y. Pan; K.K. Ng; V. Kwong 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 448 KB