✦ LIBER ✦
Low frequency noise in short-channel MOSFET's degraded by Fowler-Nordheim and Hot-Carrier Injection
✍ Scribed by Jen-Tai Hsu; Xiaoyu Li; C.R. Viswanathan
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 308 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0167-9317
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