✦ LIBER ✦

Mechanism of stress-induced leakage current in MOS capacitors

✍ Scribed by Rosenbaum, E.; Register, L.F.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Simplified quantitative stress-induced l

✍ M. Ossaimee; K. Kirah; W. Fikry; A. Girgis; O.A. Omar 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 224 KB

Gate-induced drain leakage current in MO

✍ Nathan, V.; Das, N.C. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 305 KB

Leakage current mechanisms in lead-based

✍ Nagaraj, B.; Aggarwal, S.; Song, T.; Sawhney, T.; Ramesh, R. 📂 Article 📅 1999 🏛 The American Physical Society 🌐 English ⚖ 107 KB

Stress induced leakage currents in thin

✍ D.J. DiMaria 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 339 KB

Investigation of ultralow leakage in MOS

✍ Kuan Yew Cheong; Dimitrijev, S.; Jisheng Han 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 308 KB

Characterization of leakage currents in

✍ Oualid, J.; Bouhdada, A. 📂 Article 📅 1986 🏛 IEEE 🌐 English ⚖ 504 KB