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Characterization of leakage currents in long-lifetime capacitors

✍ Scribed by Oualid, J.; Bouhdada, A.

Book ID: 114595670
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 504 KB
Volume: 33
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1986.22671

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