Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction

✍ Scribed by Verchiani, M.; Bouyssou, E.; Fiannaca, G.; Cantin, F.; Anceau, C.; Ranson, P.

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 296 KB
• Volume: 48
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2008.07.032