Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements

✍ Scribed by J. V. Manca; K. Croes; L. de Schepper; W. de Ceuninck; L. M. Stals; L. Jacques; L. Tielemans; N. Gerrits; R. Hoppener

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 123 KB
• Volume: 14
• Category: Article
• ISSN: 0748-8017
• DOI: 10.1002/(sici)1099-1638(199803/04)14:2<63::aid-qre160>3.0.co;2-p

✦ Synopsis

The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps. Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. ©1998 John Wiley & Sons, Ltd.