✦ LIBER ✦

Mechanical properties of thin Ag films on a silicon substrate studied using the nanoindentation technique

✍ Scribed by A. V. Panin; A. R. Shugurov; K. V. Oskomov

Book ID: 110144544
Publisher: SP MAIK Nauka/Interperiodica
Year: 2005
Tongue: English
Weight: 106 KB
Volume: 47
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.2131144

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Nanomechanical properties of copper thin

Nanomechanical properties of copper thin films on different substrates using the nanoindentation technique

✍ Te-Hua Fang; Win-Jin Chang 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 274 KB

Nanoindentation measurements of the mech

Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness

✍ Yifang Cao; Seyed Allameh; Derek Nankivil; Steve Sethiaraj; Tom Otiti; Wole Sobo 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 468 KB

Effects of the substrate on the determin

Effects of the substrate on the determination of thin film mechanical properties by nanoindentation

✍ Ranjana Saha; William D. Nix 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 511 KB

We examine the effects of the substrate on the determination of mechanical properties of thin films by nanoindentation. The properties of aluminum and tungsten films on the following substrates have been studied: aluminum, glass, silicon and sapphire. By studying both soft films on hard substrates a

The use of non-contact AFM with nanoinde

The use of non-contact AFM with nanoindentation techniques for measuring mechanical properties of carbon nitride thin films

✍ S Chowdhury; M.T Laugier 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 410 KB

Corrigendum to “Nanoindentation measurem

Corrigendum to “Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness” [Mater. Sci. Eng. A 427 (2006) 232–240]

✍ Yifang Cao; Seyed Allameh; Derek Nankivil; T. Stephen Sathiaraj; Tom Otiti; Wole 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 80 KB

Study of the electromigration behaviour

Study of the electromigration behaviour of Au-Ag thin films deposited on SiO2 substrate using AES, XPS and AFM techniques

✍ Cao, Lili; Shi, Fangxiao; Song, Weijie; Zhu, Yongfa 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 409 KB 👁 2 views

The purpose of this work was to study surface diffusion of atoms in Au-Ag films deposited on SiO 2 substrate under the action of a d.c. field, focusing on the effect of chemical reaction at the Au-Ag/SiO 2 interface on the electromigration behaviour. Atomic force microscopy measurement depicted the