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Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness

✍ Scribed by Yifang Cao; Seyed Allameh; Derek Nankivil; Steve Sethiaraj; Tom Otiti; Wole Soboyejo

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 468 KB
Volume: 427
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2006.04.080

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