Corrigendum to “Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness” [Mater. Sci. Eng. A 427 (2006) 232–240]

✍ Scribed by Yifang Cao; Seyed Allameh; Derek Nankivil; T. Stephen Sathiaraj; Tom Otiti; Wole Soboyejo

• Book ID: 108214612
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 80 KB
• Volume: 494
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2008.06.002