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Corrigendum to “Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness” [Mater. Sci. Eng. A 427 (2006) 232–240]

✍ Scribed by Yifang Cao; Seyed Allameh; Derek Nankivil; T. Stephen Sathiaraj; Tom Otiti; Wole Soboyejo


Book ID
108214612
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
80 KB
Volume
494
Category
Article
ISSN
0921-5093

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