๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Mechanical properties of amorphous carbon nitride thin films prepared by reactive magnetron sputter-deposition

โœ Scribed by Dong Li; Yip-Wah Chung; Ming-Show Wong; William D. Sproul


Publisher
Springer US
Year
1995
Tongue
English
Weight
379 KB
Volume
1
Category
Article
ISSN
1023-8883

No coin nor oath required. For personal study only.

โœฆ Synopsis


Nanoindentation hardness and compressive stress in amorphous carbon nitride thin films prepared by unbalanced magnetron sputter-deposition were studied. The coating hardness and compressive stress were found to be strongly dependent on processing parameters such as substrate bias and nitrogen partial pressure. Under optimized deposition conditions, carbon nitride thin films with nanoindentation hardness about 25 GPa have been coated onto Si wafers and M2 steels. A strong correlation between coating hardness and compressive stress in the coating was observed.


๐Ÿ“œ SIMILAR VOLUMES


Aluminium nitride thin films deposited b
โœ V. Dimitrova; D. Manova; T. Paskova; Tz. Uzunov; N. Ivanov; D. Dechev ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 375 KB

AlN-films prepared by dc reactive magnetron sputtering. AlN in an Ar+N 2 gas mixture have been prepared and their microstructure, hardness, refractive index and IR transmittance examined. At l = 640 nm the refractive index was 1.93 and k = 3ร—10 -3 ; high transmission occurred between [??] structure

Microstructure and mechanical properties
โœ D.G. Liu; J.P. Tu; H. Zhang; R. Chen; C.D. Gu ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 993 KB

Carbon nitride (CN x /CN x ) multilayers with sequential sp 3 -rich and sp 2 -rich layers were deposited on c-Si substrate by direct current magnetron sputtering. The composition, microstructure and morphology of the films were investigated by the X-ray photoelectron spectroscopy and transmission el