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Measurement of minority carrier lifetime profiles in silicon : G. Schwab, H. Bernt and H. Reichi. Solid-St. Electron.20, p. 91 (1977)

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 130 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90383-3

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