𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Flying-spot scanning for the separate mapping of resistivity and minority-carrier lifetime in silicon : H. Bleichner, E. Nordlander, G. Fielder and P. A. Tove. Solid-St. Electron.29(8), 779 (1986)


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
120 KB
Volume
27
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.