✦ LIBER ✦
Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon : J. C. White, T. F. Unter and J. G. Smith. Solid St. electron. Devices1 (5) 139 (Sept. 1977)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 124 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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