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Measurement and modeling of drain current DLTS in enhancement SOI MOSFETs

✍ Scribed by H. Haddara; M.T. Elewa; S. Cristoloveanu

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 675 KB
Volume: 24
Category: Article
ISSN: 0026-2692
DOI: 10.1016/0026-2692(93)90190-p

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