Characterization of SOI by capacitance and current measurements with combined gated diode and depletion-mode MOSFET structure

✍ Scribed by T.E. Rudenko; A.N. Rudenko; A.N. Nazarov; V.S. Lysenko

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 296 KB
• Volume: 28
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(95)00101-d