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Measurement and modeling of thin-film accumulation-mode SOI p-MOSFET intrinsic gate capacitances

✍ Scribed by B. Gentinne; D. Flandre; J.-P. Colinge

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement and two-dimensional simulati

✍ B. Gentinne; D. Flandre; J.-P. Colinge; F. Van De Wiele 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 762 KB

Characterization of SOI by capacitance a

✍ T.E. Rudenko; A.N. Rudenko; A.N. Nazarov; V.S. Lysenko 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 296 KB