Measurement and two-dimensional simulation of thin-film SOI MOSFETs: Intrinsic gate capacitances at elevated temperatures

✍ Scribed by B. Gentinne; D. Flandre; J.-P. Colinge; F. Van De Wiele

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 762 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00067-6