Analysis of drain breakdown voltage in enhancement-mode SOI MOSFETs : P. Smeys and J. P. Colinge. Solid-State Electronics, 36(4), 569 (1993)

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 95 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90270-4