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Low-temperature degradation studies of AlGaAs/GaAs modulation-doped field effect transistors

✍ Scribed by Soon-won Kang; Joseph Ya-min Lee

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 354 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90038-z

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