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Low-temperature degradation studies of AlGaAs/GaAs modulation-doped field effect transistors : Soon-Won Kang and Joseph Ya-Min Lee. Solid-St. Electron. 34(12), 1415 (1991)


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
116 KB
Volume
32
Category
Article
ISSN
0026-2714

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