𝔖 Bobbio Scriptorium
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Low frequency noise characterization of 0.25 μm Si CMOS transistors

✍ Scribed by T. Boutchacha; G. Ghibaudo; G. Guégan; M. Haond


Book ID
119444302
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
351 KB
Volume
216
Category
Article
ISSN
0022-3093

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