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Low damage dry etching of III–V compound semiconductors using electron cyclotron resonance discharges

✍ Scribed by S.J. Pearton; U.K. Chakrabarti; W.S. Hobson; C. Constantine; D. Johnson


Book ID
113281987
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
424 KB
Volume
59-60
Category
Article
ISSN
0168-583X

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