𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Long-term RF Burn-in Effects on Dielectric Charging of MEMS Capacitive Switches

✍ Scribed by Molinero, David; Luo, Xi; Shen, Chao; Palego, Cristiano; Hwang, James C. M.; Goldsmith, Charles L.

Book ID
120173386
Publisher
IEEE
Year
2013
Tongue
English
Weight
842 KB
Volume
13
Category
Article
ISSN
1530-4388

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Modeling of dielectric charging in RF ME
Modeling of dielectric charging in RF MEMS capacitive switches
✍ Prasad S. Sumant; Andreas C. Cangellaris; Narayana R. Aluru πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 242 KB

## Abstract A unified, macroscopic, one‐dimensional model is presented for the quantitative description of the process of dielectric charging in RF MEMS capacitive switches. The model provides for the direct incorporation of various physical factors known to impact dielectric charging, such as surf

A compact model for dielectric charging
A compact model for dielectric charging in RF MEMS capacitive switches
✍ Prasad S. Sumant; Narayana R. Aluru; Andreas C. Cangellaris πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 342 KB

A unified, macroscopic, one-dimensional model is presented for the quantitative description of the process of dielectric charging in radio frequency micro-electromechanical systems (RF MEMS) switches. The fidelity of the model relies on the utilization of experimentally obtained data to assign value