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Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches

✍ Scribed by Richard Daigler; Eleni Papandreou; Matroni Koutsoureli; George Papaioannou; John Papapolymerou


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
391 KB
Volume
86
Category
Article
ISSN
0167-9317

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