𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Temperature study of the dielectric polarization effects of capacitive RF MEMS switches

✍ Scribed by Papaioannou, G.; Exarchos, M.-N.; Theonas, V.; Guoan Wang; Papapolymerou, J.

Book ID
114660441
Publisher
IEEE
Year
2005
Tongue
English
Weight
824 KB
Volume
53
Category
Article
ISSN
0018-9480

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Modeling of dielectric charging in RF ME
Modeling of dielectric charging in RF MEMS capacitive switches
✍ Prasad S. Sumant; Andreas C. Cangellaris; Narayana R. Aluru πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 242 KB

## Abstract A unified, macroscopic, one‐dimensional model is presented for the quantitative description of the process of dielectric charging in RF MEMS capacitive switches. The model provides for the direct incorporation of various physical factors known to impact dielectric charging, such as surf

Reliability of capacitive RF MEMS switch
Reliability of capacitive RF MEMS switches at high and low temperatures
✍ Yong Zhu; Horacio D. Espinosa πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 305 KB

Some applications of RF MEMS switches, such as aircraft condition monitoring and distributed satellite communication, present a unique challenge for device design and reliability. This article examines these switches when operational temperatures in the range ؊60°C to 100°C are envisioned. The basic