We describe a new high-brightness laser-plasma source for X-rays and extreme ultraviolet (EUV) radiation. By utilizing a liquid target the harmful emission of debris is significantly reduced or completely eliminated. The spectrum can be spectrally tailored by choosing a suitable liquid. We also show
Liquid-target laser-plasma source for X-ray lithography
โ Scribed by L. Malmqvist; A.L. Bogdanov; L. Montelius; H.M. Hertz
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 97 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0167-9317
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โฆ Synopsis
Division of Atomic Physics tDivision of Solid State Physics
We describe a compact and practically debris-free laser-plasma x-ray source suitable for proximity lithography. The source is based on a microscopic fluorocarbon continuous liquid jet droplet target, generating highbrightness ~=1.2-1.7 nm x-ray emission with -5% conversion efficiency. This target type has the advantages of producing only negligible amounts of debris, and being regenerative, thereby allowing high-repetition-rate uninterrupted operation. The source is combined with an Au/SiNx x-ray mask to demonstrate lithography of sub-100 nm structures in SAL-601 chemically enhanced resist.
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