๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Leakage power analysis of 25-nm double-gate CMOS devices and circuits

โœ Scribed by Keunwoo Kim; Das, K.K.; Joshi, R.V.; Ching-Te Chuang


Book ID
114617780
Publisher
IEEE
Year
2005
Tongue
English
Weight
464 KB
Volume
52
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES