✦ LIBER ✦
Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's
✍ Scribed by Williams, S.C.; Kim, K.W.; Littlejohn, M.A.; Holton, W.C.
- Book ID
- 114537828
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 466 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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