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Leakage current, active power, and delay analysis of dynamic dual Vt CMOS circuits under P–V–T fluctuations

✍ Scribed by Jinhui Wang; Na Gong; Ligang Hou; Xiaohong Peng; Ramalingam Sridhar; Wuchen Wu


Book ID
113800493
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
449 KB
Volume
51
Category
Article
ISSN
0026-2714

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