Au films of thickness ranging between 5 and 52 nm were prepared by sputtering on quartz substrates and their third-order nonlinear optical response was investigated by Optical Kerr effect (OKE) and Z-scan techniques using 532 nm, 35 ps laser pulses. All prepared films were characterized by XRD, AFM
Large Third-Order Nonlinear Optical Properties of Cadmium Oxide Thin Films
โ Scribed by Gulino, Antonino; Compagnini, Giuseppe; Scalisi, Alessandro A.
- Book ID
- 127046783
- Publisher
- American Chemical Society
- Year
- 2003
- Tongue
- English
- Weight
- 102 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0897-4756
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