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Kink-related noise overshoot in SOI n-MOSFETS operating at 4.2 K

✍ Scribed by Simoen, E.; Dierickx, B.; Claeys, C.

Book ID: 111676474
Publisher: The Institution of Electrical Engineers
Year: 1992
Tongue: English
Weight: 306 KB
Volume: 28
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:19920364

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