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[IEEE 1990 IEEE SOS/SOI Technology Conference. - Key West, FL, USA (2-4 Oct. 1990)] 1990 IEEE SOS/SOI Technology Conference. Proceedings - Noise overshoot at drain current kink in SOI MOSFET

✍ Scribed by Chen, J.; Fang, P.; Ko, P.K.; Hu, C.; Solomon, R.; Chan, T.-Y.; Sodini, C.G.

Book ID: 111676740
Publisher: IEEE
Year: 1990
Weight: 163 KB
Volume: 0
Category: Article
ISBN-13: 9780879425739
DOI: 10.1109/sossoi.1990.145699

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