The effect of dose and temperature on th
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N. Hatzopoulos; R. Chater; U. Bussmann; P.L.F. Hemment; J.A. Kilner
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Article
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1992
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Elsevier Science
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English
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The effect of implantation temperature and oxygen dose on the structure of as-implanted separation by implantation of oxygen (SIMOX) wafers was studied by means of Rutherford backscattering spectrometry and ion channelling, secondary ion mass spectrometry and cross-sectional transmission electron mi