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Kinetic Stress Testing and the Influence of Long-Time Anneals on the Behavior of IZO Thin Film Transistors

โœ Scribed by Vemuri, Rajitha N. P.; Marrs, Michael A.; Alford, Terry L.


Book ID
121712270
Publisher
IEEE
Year
2013
Tongue
English
Weight
842 KB
Volume
60
Category
Article
ISSN
0018-9383

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