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IVB-5 fatigued-induced defects in MNOS devices

✍ Scribed by Ko, C.K.; Senturia, S.D.; Burns, J.A.

Book ID: 114593918
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 94 KB
Volume: 28
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1981.20562

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