✦ LIBER ✦
Source/drain induced defects in advanced MOSFETs: what device electrical characterization tells
✍ Scribed by Mouis, Mireille; Lee, Jae Woo; Jeon, Daeyoung; Shi, Ming; Shin, Minju; Ghibaudo, Gérard
- Book ID
- 121477087
- Publisher
- John Wiley and Sons
- Year
- 2013
- Tongue
- English
- Weight
- 411 KB
- Volume
- 11
- Category
- Article
- ISSN
- 1862-6351
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