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Irradiation damages in electron beam lithography

โœ Scribed by Sun Yuping; Zhu Wenzhen; Liang Junhou; Ge Huang; Liang Jiuchun


Book ID
112890754
Publisher
SP Science Press
Year
1986
Tongue
English
Weight
372 KB
Volume
3
Category
Article
ISSN
0217-9822

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Resist debris formation in electron beam
โœ P.R. Deshmukh; K.J. Rangra; O.P. Wadhawan ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 978 KB

The resist debris (RD) formation dependence on beam stepping to beam size ratio in electron beam lithography (EBL) is theoretically and experimentally investigated. The theoretically simulated results show a distinct variation in RD formation as the beam stepping to beam size ratio is varied from 0.