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Ion channeling analysis of MBE grown Si1−xGex/Si strained layer superlattices

✍ Scribed by N.R. Parikh; G.S. Sandhu; N. Yu; W.K. Chu; T.E. Jackman; J.-M. Baribeau; D.C. Houghton

No coin nor oath required. For personal study only.

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