✦ LIBER ✦

Spectroscopic ellipsometric characterization of Si/Si1−xGex strained-layer supperlattices

✍ Scribed by H. Yao; J.A. Woollam; P.J. Wang; M.J. Tejwani; S.A. Alterovitz

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Photoreflectance study of strained (001)

✍ Yichun Yin; Fred H. Pollak; P. Auvray; D. Dutartre; R. Pantel; J.A. Chroboczek 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 320 KB

Ion channeling analysis of MBE grown Si1

✍ N.R. Parikh; G.S. Sandhu; N. Yu; W.K. Chu; T.E. Jackman; J.-M. Baribeau; D.C. Ho 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 509 KB

Elastic strain energy of graded Si1−xGex

✍ G. Heigl; G. Span; E. Kasper 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 350 KB

Electroreflectance spectroscopy of strai

✍ T. Ebner; K. Thonke; R. Sauer; F. Schäffler; H.J. Herzog 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 287 KB

Spectroscopic ellipsometry of optical tr

✍ F. Ferrieu; F. Beck; D. Dutartre 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 329 KB

Luminescence of strained Si1−xGex/Si qua

✍ S. Fukatsu; Y. Shiraki 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 694 KB