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Influence of substrate orientation on the characteristics of Si1−xGex/Si strained layers grown by MBE

✍ Scribed by Etoh, H.; Murakami, E.; Ishizaka, A.; Shimada, T.; Miyao, M.


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
356 KB
Volume
99
Category
Article
ISSN
0022-0248

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