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Investigation on bias stress effects in n-type PDI8-CN2 thin-film transistors

✍ Scribed by F.V. Di Girolamo; F. Ciccullo; M. Barra; A. Carella; A. Cassinese

Book ID: 119340074
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 938 KB
Volume: 13
Category: Article
ISSN: 1566-1199
DOI: 10.1016/j.orgel.2012.06.044

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