Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states

✍ Scribed by Wrachien, N.; Cester, A.; Lago, N.; Meneghesso, G.; D’Alpaos, R.; Stefani, A.; Turatti, G.; Muccini, M.

• Book ID: 126716695
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 478 KB
• Volume: 54
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2014.07.065