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Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors

✍ Scribed by Kim, Do Hyung; Jung, Hyun Kwang; Yang, Woochul; Kim, Dae Hwan; Lee, Sang Yeol


Book ID
123456160
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
535 KB
Volume
527
Category
Article
ISSN
0040-6090

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