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Investigation of the effects of high temperature implantation and post implantation annealing on the electrical behavior of nitrogen implanted β-SiC films

✍ Scribed by Reichert, W.; Lossy, R.; González Sirgo, M.; Obermeier, E.; Skorupa, W.


Book ID
122860534
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
398 KB
Volume
6
Category
Article
ISSN
0925-9635

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