Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique

✍ Scribed by Wang, T.; Chang, T.-E.; Chiang, L.-P.; Wang, C.-H.; Zous, N.-K.; Huang, C.

• Book ID: 114537357
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 223 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.701482