Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique

✍ Scribed by Tahui Wang; Lu-Ping Chiang; Nian-Kai Zous; Tse-En Chang; Chimoon Huang

• Book ID: 114537397
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 180 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.704380