✦ LIBER ✦
Detection of traps induced and activated by high field stress in an N-channel VDMOSFET transistor using current deep level transient spectroscopy (CDLTS)
✍ Scribed by N. Abboud; Y. Cuminal; A. Foucaran; C. Salame
- Book ID
- 113797900
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 673 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0167-9317
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