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Investigation of microstructure evolution in Pt-doped TiO2 thin films deposited by rf magnetron sputtering

✍ Scribed by Xu Wenbin; Dong Shurong; Wang Demiao; Ren Gaochao

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
308 KB
Volume
403
Category
Article
ISSN
0921-4526

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