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Investigation of Low-Frequency Noise in N-Channel FinFETs From Weak to Strong Inversion

✍ Scribed by Chengqing Wei; Yong-Zhong Xiong; Xing Zhou


Book ID
114619792
Publisher
IEEE
Year
2009
Tongue
English
Weight
969 KB
Volume
56
Category
Article
ISSN
0018-9383

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